2026-08-06T16:29:01Z https://icatplus.esrf.fr/oaipmh/request

oai:icatplus.esrf.fr:inv/2437810107 2026-07-20T06:00:45.646Z

4.2 EI 10.15151/ESRF-ES-2437810107 Claire BOURQUARD Claire Bourquard 0000-0003-0669-3648 JUAN MANUEL CARRILLO LARREA Juan Manuel Carrillo Larrea Eleni CHARITOUDI Eleni Charitoudi Claire BOURQUARD Claire Bourquard 0000-0003-0669-3648 Steven LEAKE Steven Leake 0000-0003-1640-0386 Eleni CHARITOUDI Eleni Charitoudi JUAN MANUEL CARRILLO LARREA Juan Manuel Carrillo Larrea Example Institute 2029 Data from large facility measurement 2026-07-15T06:00:00Z/2026-07-20T06:00:00Z 2026-07-20T06:00:00Z I CC-BY-4.0 We propose to acquire operando time-resolved Full-Field Diffraction X-ray Microscopy (sFFDXM) images of AlN/Sapphire Surface Acoustic Wave (SAW) devices. Recent studies have shown that the AlN/Sapphire bilayer structure for SAW sensors is promising as it can withstand higher temperatures and operate at higher frequencies than Langasite which is the current standard for high-temperature applications. [1] A timely and spatially resolved characterization of the wave propagation in the piezoelectric layer and the substrate will extend our physical description of the currently misunderstood sources of losses of SAW based sensors that can operate at high temperatures. This can be done with the material selectivity and resolution of sFFDXM. This proposal builds upon the lessons learnt from the beamtime related to proposal ME-1648 and the in-house experiment BLC 15862.