2026-05-31T22:44:40Z https://icatplus.esrf.fr/oaipmh/request

oai:icatplus.esrf.fr:inv/1830138004 2025-06-06T14:13:36.715Z

4.2 EI 10.15151/ESRF-ES-1830138004 Tobias SCHULLI Tobias Schulli Minsoo KANG Minsoo Kang 0000-0002-0390-5951 Minsoo KANG Minsoo Kang 0000-0002-0390-5951 Jaeyun MOON Jaeyun Moon Jaeyun MOON Jaeyun Moon Samuel KIELAR Samuel Kielar 0000-0003-0141-9332 Amelia SCHAEFFER Amelia Schaeffer 0000-0003-2268-2965 Example Institute 2027 Data from large facility measurement 2024-09-05T06:00:00Z/2024-09-09T06:00:00Z 2024-09-09T06:00:00Z I CC-BY-4.0 Despite increasing needs for efficient thermal solutions for next-generation radio-frequency (RF) devices for 5G/6G communications, accurate spatial temperature characterizations of these devices are lacking, hindering efforts to develop effective thermal designs. During the proposed beamtime, we aim to develop a novel, X-ray nano-diffraction-based thermal metrology technique to accurately characterize internal temperatures of RF devices made of crystalline multi-layers with tens of nm spatial resolution. If successful, our work will deliver, for the first time, a high-resolution internal temperature map of RF devices in situ. Subsequently, we anticipate new innovations in thermal solutions in these electronic devices.